Laboratories

Microelectronics Laboratory
General Purpose

Virtual Device Fabrication and Simulation Lab
General Purpose

Microprocessor Lab
General Purpose

Sensors and Systems Lab
General Purpose

Analog and Digital Circuits Labs
General Purpose

Analog and Digital Communication Lab
General Purpose

Optical Communication Lab
General Purpose

Digital Signal Processing Lab
General Purpose

Microwave Engineering Lab
General Purpose

Antenna Engineering Lab
General Purpose
Tinkering Lab
General Purpose

SMDP-C2SD (VLSI) Lab
General Purpose
Microelectronics Laboratory

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Microelectronics Laboratory

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Microelectronics Laboratory

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Microelectronics Laboratory

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Analog and Digital Circuits Labs

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Analog and Digital Communication Lab

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Optical Communication Lab

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Digital Signal Processing Lab

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Microwave Engineering Lab

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox
Antenna Engineering Lab

This lab is used for the fabrication and characterization of microlectronic and nanoelectronic devices for electronic, gas sensing and optoelectronic applications. The list of facilities available in this lab is given below:
- Semiconductor Parameter Analyser (Keysight, B1500A)
- Monochromater and Light Source (Princeton Instruments)
- PL-FLS980 (Edinburgh Instruments)
- Solar Simulator from PET
- Spin Coating System
- LCR Meter (HP)
- E-beam Coating System (HHV)
- Thermal Deposition Unit (HHV)
- LTAVD Unit (Vapour Technologies, Mount Vernon (USA))
- Four Point Probe Measurement
- Reflectometer (F20-UV)
- Stacked Furnace (Thermco (USA))
- Ellipsometer (Gaertner Scientific)
- Plasma Cleaner (Femto Science)
- Hall Effect measurement (HMS-3000)
- Milli-Q DI water plant
- Glovebox