Instruments
![High Resolution Transmission Electron Microscope TEM](/contents/institute/rnd/cif/img/lab/instruments_cif_hr-tem.jpg)
High Resolution Transmission Electron Microscope (HR- TEM)
Model: Tecnai G2 20 TWINCompany: FEI Company of USA (S.E.A.) PTE, LTD
EDS:TEAM EDS SYSTEM with Octane Plus SDD Detector
Company: EDAX Inc.
[External Form]
![SEM](/contents/institute/rnd/cif/img/lab/instruments_cif_hr-sem.jpg)
High Resolution Scanning Electron Microscope (HR- SEM)
Model: Nova Nano SEM 450Company: FEI Company of USA (S.E.A.) PTE, LTD
EDS:Team Pegasus Integrated EDS-EBSD with Octane Plus and Hikari Pro
Company: EDAX Inc.
[External Form]
![Scanning Electron Microscope](/contents/institute/rnd/cif/img/lab/instruments_cif_sem.jpg)
Scanning Electron Microscope (SEM)
Model: EVO - Scanning Electron Microscope MA15 / 18Company: CARL ZEISS MICROSCOPY LTD.
EDS:51N1000 – EDS System
Company: Oxford Instruments Nanoanalysis.
[External Form]
![Scanning Probe Microscope (SPM)](/contents/institute/rnd/cif/img/lab/instruments_cif_spm.jpg)
Scanning Probe Microscope (SPM)
Model:NTEGRA PrimaCompany: NT-MDT Service & Logistics Ltd.
[External Form]
![Nuclear Magnetic Resonance Spectroscopy](/contents/institute/rnd/cif/img/lab/instruments_cif_nmr.jpg)
Nuclear Magnetic Resonance Spectroscopy 500MHz (NMR)
Model: AVH D 500 AVANCE III HD 500 MHɀ OneBay NMR SpectrometerCompany: BRUKER BioSpin INTERNATIONAL AG
[External Form]
![Magnetic Property Measurement System (MPMS)](/contents/institute/rnd/cif/img/lab/instruments_cif_hr-mpms.jpg)
Magnetic Property Measurement System (MPMS)
Model: SQUID Based Magnetometer (MPMS® 3)Company: Quantum Design Inc.
[External Form]
![High Resolution X-Ray Diffraction (HR-XRD)](/contents/institute/rnd/cif/img/lab/instruments_cif_hr-xrd.jpg)
High Resolution X-Ray Diffraction (HR-XRD)
Model: Rigaku SmartLab 9kW Powder type (without χcradle)Company: RIGAKU Corporation
[External Form]
![Bench Top X-Ray Diffraction (BT-XRD)](/contents/institute/rnd/cif/img/lab/instruments_cif_bt-xrd.jpg)
Bench Top X-Ray Diffraction (BT-XRD)
Model: Rigaku Miniflex 600 Desktop X-Ray Diffraction SystemCompany: RIGAKU Corporation
[External Form]
![Gallery Main Workshop](/contents/institute/rnd/cif/img/lab/instruments_cif_protyping_machine.jpg)
PCB Protyping Machine
Model: LPKF-PCB ProtoMat S103Company: LPKF Laser & Electronics AG
[External Form]
![Ion Chromatography](/contents/institute/rnd/cif/img/lab/instruments_cif_chromatography.jpg)
Ion Chromatography
Model: Dual channel 930 Compact IC Flex ChS/PP --- MetrohmCompany: Metrohm AG
[External Form]
![Multi Function Tribometer](/contents/institute/rnd/cif/img/lab/instruments_cif_mf-tribometer.jpg)
Multi Function Tribometer
Model: Rtec Multi Functional TribometersCompany: RTECH INSTRUMENTS
[External Form]
![Fourier Transform Infrared Spectroscopy (FTIR)](/contents/institute/rnd/cif/img/lab/instruments_cif_ftir.jpg)
Fourier Transform Infrared Spectroscopy (FTIR)
Model: Nicolet iS5Company: THERMO Electron Scientific Instruments LLC
[External Form]
![Thermogravimetric Analysis (TGA)](/contents/institute/rnd/cif/img/lab/cif_tga_01.jpg)
Thermogravimetric Analysis (TGA)
Model: TGA-50Company: M/s Shimadzu (Asia Pacific) Pte Ltd.
[External Form]
![Differential Scanning Calorimetry (DSC)](/contents/institute/rnd/cif/img/lab/cif_dsc_01.jpg)
Differential Scanning Calorimetry (DSC)
Model: DSC-60 PlusCompany: M/s Shimadzu (Asia Pacific) Pte Ltd.
[External Form]
![Surface Area Measurement Facility (BET)](/contents/institute/rnd/cif/img/lab/cif_bet_01.jpg)
Surface Area Measurement Facility (BET)
Model: BELLSORP MAX II & BELCAT-IICompany: MicrotracBEL Corp.br> [External Form]
![Inductively Coupled Plasma Mass](/contents/institute/rnd/cif/img/lab/cif_icpms_01.jpg)
Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
Model: Agilent 7800 ICP-MS mainframeCompany: Agilent Technologies
[External Form]
![X-ray photoelectron spectroscopy](/contents/institute/rnd/cif/img/lab/cif_xps_01.jpg)
X-ray photoelectron spectroscopy (XPS)
Model: K-AlphaCompany: Thermo Fisher Scientific
[External Form]